Changjiang Daily: Schools and enterprises collaborate to tackle testing technology, and the order volume of high - reliability memories hits a new high.

In the testing laboratory of Changjiang Wanrun Semiconductor, the staff are testing the memories.

　　At the beginning of the New Year, Hubei Changjiang Wanrun Semiconductor Technology Co., Ltd. (hereinafter referred to as "Changjiang Wanrun Semiconductor") is busier than in previous years. "In January this year, the memory business has reached a record high for the same period in history. Since the end of last year, we have gone all out to prepare and seized the first quarter, which is the most crucial business development period of the whole year," Li Silin, General Manager of Changjiang Wanrun Semiconductor, told a reporter from the Changjiang Daily.

　　The memory is the "memory center" of electronic devices, and the performance and reliability of the memory safeguard data security. The reporter saw in the testing laboratory of Changjiang Wanrun Semiconductor located in Qingshan District that several memory products were orderly entering the testing equipment, which is one of the core links in memory production.

　　"Every product must pass strict testing before it can be delivered to customers," Dr. Guo Jizhi, Deputy General Manager and Technical Director of Changjiang Wanrun Semiconductor, said while looking at the products being tested. "Some memories are designed to ensure stable data storage for 5 years under extreme conditions ranging from minus 40 degrees Celsius to 85 degrees Celsius. If the product is damaged or data is lost in less than 5 years during actual use, no one will use such a product again."

　　Guo Jizhi said that the internal circuits of semiconductor memories are extremely complex, and only through strict actual testing can customers be assured. Therefore, testing technology is also one of the core technologies in the storage field.

　　In 2024, Changjiang Wanrun Semiconductor and the School of Integrated Circuits of Huazhong University of Science and Technology jointly established a High-Reliability Storage Joint Laboratory, and jointly carried out research on testing technology for flash memory particles of core components, and conducted extreme tests on the products of major global flash memory wafer manufacturers.

　　"This process is a bit like a medical examination in a hospital. The data of height, weight, and blood routine measured by different hospitals are more or less the same, and in the end, it depends on whose analysis is more accurate. Our laboratory uses an artificial neural network algorithm to build a model to achieve precise detection, analysis, and prediction of the quality and life cycle of flash memory particles." Guo Jizhi said that compared with conventional testing methods, this algorithm has the ability to "learn" and update itself, making the test results more accurate and precisely distinguishing between good and bad products.

　　The accuracy of the testing level has been recognized by the market. Li Silin introduced that currently, the yield rate of Changjiang Wanrun Semiconductor's memories is at a relatively high level in the industry, and the continuous improvement of product reliability has become one of the important factors for business development.

　　"The memory industry is highly competitive, and the technology upgrade cycle is as short as a few months. Every 5% improvement in the reliability of testing technology can create a huge gap at the product level. The pace of technological research and development and upgrading can never stop." Li Silin said that Changjiang Wanrun Semiconductor is accelerating the research and development of self-developed intelligent flash memory and memory testing equipment, responding to the development strategies of Hubei Province and Changjiang Industrial Investment Group, and continuously laying out key areas of consumer-grade, industrial-grade, and automotive-grade storage.